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Synchrotron x-ray topography of III-V semiconductors

Referentgranskad
Tuomi, T.
-2000

X-ray Topography of Semiconductors Using Synchrotron Radiation

Rantamäki, R.
Teknillinen korkeakoulu1999

Synchrotron x-ray topography of electronic materials

Referentgranskad
Tuomi, Turkka
Journal of Synchrotron Radiation2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Referentgranskad
Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, Turkka; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.;...
-2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Referentgranskad
Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...
Materials Research Society Symposia Proceedings2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...
-2002

Synchrotron topography for defect characterization in III-V semiconductors.

Tuomi, T.; Danilewsky, A.; McNally, P.; Taskinen, M.; Schweitzer, M.
-1995

Synchrotron X-ray topography of undoped VCz GaAs crystals

Referentgranskad
Tuomi, T.; Knuuttila, L.; Riikonen, J.; McNally, P.J.; Chen, Weimin; Kanatharana, J.; Neubert, M.; R...
Journal of Crystal Growth2002

Synchrotron x-ray topography of cuprite using conventional thin sections

Danilewsky, A.N.; Schropp, B.; Kek, S.; Tuomi, T.; Taskinen, M.; Rantamäki, R.; McNally, P.J.; Curle...
-1997

White beam synchrotron x-ray topography studies of copper interconnect inducec strain in Si ic processing

Kanatharana, J.; McNally, P.J.; Tuomi, T.; Toh, B.H.W.; McNeill, D.; Chen, W.M.; Riikonen, J.; Knuut...
-2002

Synchrotron x-ray topography of III-V semiconductors

Referentgranskad
2000

X-ray Topography of Semiconductors Using Synchrotron Radiation

1999

Synchrotron x-ray topography of electronic materials

Referentgranskad
2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Referentgranskad
2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Referentgranskad
2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

2002

Synchrotron topography for defect characterization in III-V semiconductors.

1995

Synchrotron X-ray topography of undoped VCz GaAs crystals

Referentgranskad
2002

Synchrotron x-ray topography of cuprite using conventional thin sections

1997

White beam synchrotron x-ray topography studies of copper interconnect inducec strain in Si ic processing

2002